. da ta - a n ] 6 M ay 2 00 3 Bayesian inference of nanoparticle - broadened x - ray line profiles

نویسندگان

  • N. Armstrong
  • W. Kalceff
  • J. P. Cline
  • J. Bonevich
چکیده

A single and self-contained method for determining the crystallite-size distribution and shape from experimental x-ray line profile data is presented. We have shown that the crystallite-size distribution can be determined without assuming a functional form for the size distribution, determining instead the size distribution with the least assumptions by applying the Bayesian/MaxEnt method. The Bayesian/MaxEnt method is tested using both simulated and experimental CeO 2 data. The results demonstrate that the proposed method can determine size distributions, while making the least number of assumptions.

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تاریخ انتشار 2003